Analytical Models of Conductivity-Channel Tracking,

Abstract

A new analytical model for the tracking force on an ultrarelativistic electron beam in a conductivity channel is derived from the complete Frozen Field Equations. The model assumes the beam to be entirely within a sharp-edged constant conductivity channel. Axial return currents are ignored except at the channel boundary, and the drift tube wall is assumed to be at large radius. It is shown, however, that these latter restrictions are not serious, although a small drift tube radius may complicate measurement of the tracking force. This Frozen Field Tracking Model reduces to the Electrostatic Tracking Model in the appropriate limit, but in other cases predicts slightly larger, sometimes oscillatory forces. The analysis also indicates that magnetic fields can play a positive role in tracking. For completeness, channel tracking forces for the New Field Equations with and without an axial displacement current are derived. With the displacement current the New Field Equations exhibit tracking qualitatively similar to that of the full Frozen Field Equations, while without it they exhibit tracking as described by the Electrostatic Tracking Model.

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Document Details

Document Type
Technical Report
Publication Date
Apr 04, 1987
Accession Number
ADA181546

Entities

People

  • Brendan B. Godfrey
  • Dale R. Welch

Organizations

  • Leidos

Tags

Communities of Interest

  • Advanced Electronics
  • Energy and Power Technologies

DTIC Thesaurus Topics

  • Axisymmetric
  • Bessel Functions
  • Boundaries
  • Cancellation
  • Classification
  • Conductivity
  • Continuity
  • Differential Equations
  • Electric Fields
  • Electromagnetic Fields
  • Electron Beams
  • Equations
  • Magnetic Fields
  • Magnetic Forces
  • Numerical Analysis
  • Security
  • Two Dimensional

Fields of Study

  • Physics

Readers

  • Control Systems Engineering.
  • Plasma Physics / Magnetohydrodynamics

Technology Areas

  • Directed Energy
  • Microelectronics
  • Microelectronics - Microelectromechanical Systems