Investigation of the Electron Transport Properties That Initiate Second Breakdown.

Abstract

This paper shows that the phenomenon known as second breakdown is an unstable transition from single carrier, space charge limited current to double carrier injection. This conclusion is based on analysis is showing the transition from single to double carrier injection is inherently unstable on thermodynamic grounds and leads to current filament formation; the primary phenomena associated with second breakdown. Keywords: Second breakdown; Failure mechanisms; Semiconductor.

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Document Details

Document Type
Technical Report
Publication Date
Apr 01, 1987
Accession Number
ADA181703

Entities

People

  • Mark Snyder

Organizations

  • Air Force Research Laboratory

Tags

Communities of Interest

  • Advanced Electronics

DTIC Thesaurus Topics

  • Bipolar Junction Transistors
  • Boundaries
  • Conductivity
  • Current Density
  • Electronics Laboratories
  • Energy Bands
  • Equations
  • Fermi Levels
  • Materials
  • P-N Junctions
  • Pin Diodes
  • Pnp Transistors
  • Schematic Diagrams
  • Semiconductor Devices
  • Semiconductors
  • Silicon Carbide
  • Transistors

Fields of Study

  • Engineering

Readers

  • Optical Physics and Photonics.
  • Quantum spin resonance or Electron Paramagnetic Resonance spectroscopy.
  • Systems Analysis and Design

Technology Areas

  • Microelectronics
  • Space
  • Space - Hall-Effect Thruster