Optical Technique for the Measurement of High Temperature Material Erosion.

Abstract

Holographic Interferometry was attempted as a means of monitoring surface erosion and rejected because of large signal-to-noise problems. A new type of common path diffuse point interferometer has been developed to profile (electrode) surfaces. Initial studies show that the stability of this interferometer is at least two orders of magnitude better than what has been seen with standard Michelson's interferometer. Some measurements carried out with this interferometer are reported here. Keywords: Diffuse point interferometer, Holographic interferometry, Glow discharge, Vacuum chamber, Surface erosion, Common path interferometer, Aluminum, High temperature, Test methods, Erosion.

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Document Details

Document Type
Technical Report
Publication Date
Mar 01, 1987
Accession Number
ADA182182

Entities

People

  • J. D. Trolinger
  • K. A. Arunkumar

Tags

Communities of Interest

  • Energy and Power Technologies
  • Weapons Technologies

DTIC Thesaurus Topics

  • Detection
  • Detectors
  • Displacement
  • Electrodes
  • Environment
  • High Temperature
  • Holograms
  • Holography
  • Interferometers
  • Interferometry
  • Materials
  • Mathematical Analysis
  • Measurement
  • Monitoring
  • Perturbations
  • Propulsion Systems
  • Standards

Fields of Study

  • Physics

Readers

  • Optical Physics and Photonics.
  • Regression Analysis.
  • Surface Engineering/Surface Coating Technology.