Atomic Force Microscopy of Liquid-Covered Surfaces: Atomic Resolution Images.

Abstract

Images of graphite surfaces that are covered with oil reveal hexagonal rings of carbon atoms. Images of a sodium chloride, surface, protected from moisture by oil, exhibit a mono-atomic step. Together, these images demonstrate the potential of Atomic Force Microscopy (AFM) for studying both conducting and non-conducting surfaces - even surfaces covered with liquids. Our AFM uses a cross of double wires with an attached diamond stylus as a force sensor. The force constant is approximately 40 N/m. The resonant frequency is approximately 3 kHz. The lateral and vertical resolutions are 0.15 and 5 pm.

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Document Details

Document Type
Technical Report
Publication Date
Jun 19, 1987
Accession Number
ADA182482

Entities

People

  • B. Drake
  • O. Marti
  • Paul K. Hansma

Organizations

  • University of California, Santa Barbara

Tags

Communities of Interest

  • Advanced Electronics
  • Air Platforms

DTIC Thesaurus Topics

  • Acquisition
  • Alkanes
  • Chlorides
  • Deflection
  • Elements
  • Frequency
  • Graphitic Materials
  • Image Processing
  • Metal Plates
  • Metals
  • Microscopes
  • Microscopy
  • Military Research
  • Moisture
  • Resonant Frequency
  • Sodium
  • Sodium Compounds

Fields of Study

  • Physics

Readers

  • Optical Physics and Photonics.
  • Thin Film Deposition Science.