Predictors of Organizational-Level Testability Attributes

Abstract

A program was undertaken to develop analysis and prediction procedures for evaluation testability attributes of complex electronic equipment at the organizational level of maintenance. The development of testability attribute definitions and analysis procedures was completed as the first phase of this effort and is documented in detail in RADC-TR-85-268, Prediction and Analysis of Testability Attributes: Organizational-Level Testability attribute predictors and prediction procedures. A total of 22,000 maintenance actions were examined for 38 line replaceable units, and predictors were developed for the following: Cannot Duplicate burden (CND burden): CND as a percentage of all maintenance actions. CND burden can be used as an estimator of the Fraction of False Alarms (FFA); Cannot Duplicate Rate (CND rate): The number of CND events per operating hour. CND rate can be used as an estimator of False Alarm Rate (FAR); Isolation Level (IL): The available percentage of fault isolation conclusions. IL can be used as an estimator of Fraction of Faults Isolated (FFI) ; and Detection Percentage (DP): The attainable percentage of detection conclusions. DP can be used as an estimator of Fraction of Faults Detected (FFD).

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Document Details

Document Type
Technical Report
Publication Date
May 01, 1987
Accession Number
ADA183142

Entities

People

  • A. Elizabeth Gilreath
  • Brian A. Kelley
  • William R. Simpson

Organizations

  • ARINC

Tags

Communities of Interest

  • Advanced Electronics
  • Energy and Power Technologies
  • Ground and Sea Platforms
  • Human Systems
  • Space
  • Weapons Technologies

DTIC Thesaurus Topics

  • Accuracy
  • Air Force
  • Circuit Analysis
  • Classification
  • Computers
  • Data Analysis
  • Databases
  • Detection
  • Electronic Equipment
  • Engineering
  • Failure Analysis
  • Failure Mode And Effect Analysis
  • Maintenance
  • Maintenance Personnel
  • Reliability
  • Test And Evaluation
  • Test Equipment

Readers

  • Fault Tolerant Diagnosis of Black and White Balloon Isolation Tests Using ¥.
  • Logistics and Supply Chain Management.
  • Regression Analysis.

Technology Areas

  • Microelectronics