An XPS (X-Ray Photoelectron Spectroscopy) Study of the Composition of Thin Polyimide Films Formed by Vapor Deposition.

Abstract

Films of polyimide (> 8nm) were formed on a polycrystalline silver surface following heating of a vapor deposited layer of 4,4' oxydianiline (ODA) and 1,2,4,5 Benzenetetracarboxylic anhydride 4 (PMDA). The imidization reaction leading to polymer formation was followed in situ with X-ray Photoelectron Spectroscopy. The uncertainties inherent in a quantitative analysis of the composition of the top 8 nm surface layer (corresponding to the sampling depth of the technique) are discussed with respect to thick films of OFA and PMDA adsorbed on a clean copper (111) surface at 200 K. The fully cured polyimide film contains excess ODA-like and PMDA-like constituents as trapped molecules or terminal groups.

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Document Details

Document Type
Technical Report
Publication Date
Jul 15, 1987
Accession Number
ADA183211

Entities

People

  • C. W. Kong
  • J. Baxter
  • M. Grunze
  • R. N. Lamb
  • W. N. Unertl

Organizations

  • University of Cambridge

Tags

Communities of Interest

  • Energy and Power Technologies

DTIC Thesaurus Topics

  • Chemistry
  • Electron Energy
  • Electrons
  • Elements
  • Emission
  • Energy
  • Films
  • Materials
  • Measurement
  • Military Research
  • Photoelectrons
  • Spectroscopy
  • Thick Films
  • Thin Films
  • Vapor Deposition
  • X Ray Photoelectron Spectroscopy
  • X Rays

Readers

  • Polymer Science and Engineering.
  • Thin Film Deposition Science.

Technology Areas

  • Microelectronics
  • Microelectronics - Graphene