Electro-Optical Characterization of the Tektronix TK512M-011 CCD (Charge-Coupled Device).

Abstract

The electro-optical characterization of the first in a new series of charged Coupled Devices is described. This device, the TK512M-011, is a frontside-illuminated CCD with a 512 by 512 format and 27 by 27 micron pixels. Electro-optical characteristics measured in this study include linearity, blooming, dark count rate, charge transfer efficiency (CTE), and quantum efficiency. The results of a detailed study of the noise characteristics of the CCD out-put FET are reported. The TK512M-011 has excellent photometric linearity, high well capacity, and a low dark count rate. Very good low light level CTE is observed in the parallel shift direction, however CTE problems are observed in the serial direction. The quantum efficiency of the frontside- illuminated CCD over the wavelength range of 400 to 1000 nm is reported and is lower than expected based on experience with other similar devices. The noise of the output FET of the CCD is equivalent to 5 to 12 electrons depending upon the FET operating conditions and system bandwidth. A very small latent image effect is noted. The conclusion of this evaluation is that despite the problems observed, the frontside-illuminated CCD is an excellent sensor for scientific imaging applications.

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Document Details

Document Type
Technical Report
Publication Date
Jul 07, 1987
Accession Number
ADA183233

Entities

People

  • Gary R. Sims
  • Jonathan V. Sweedler
  • M. Bonner Denton
  • Patrick M. Epperson
  • Thomas W. Mccurnin

Organizations

  • University of Arizona

Tags

Communities of Interest

  • Advanced Electronics
  • Biomedical
  • Materials and Manufacturing Processes
  • Sensors

DTIC Thesaurus Topics

  • Charge Carriers
  • Charge Coupled Devices
  • Charge Transfer
  • Detectors
  • Digital Images
  • Efficiency
  • Electrons
  • Image Processing
  • Low Light Levels
  • Measurement
  • Optical Properties
  • Quantum Efficiency
  • Radiation
  • Semiconductor Devices
  • Semiconductors
  • Spectra
  • X Rays

Fields of Study

  • Physics

Readers

  • Image Processing and Computer Vision.
  • Semiconductor Device Technology

Technology Areas

  • Microelectronics
  • Microelectronics - Microelectromechanical Systems
  • Quantum Computing