Collection of Preprints and Reprints.

Abstract

Contents: Calculation of the Coverage Parameter for the Reliability Modeling of Fault-Tolerant Computer Systems; Properties of Transient Errors Due to Power Supply Disturbances; Concurrent Built-In Logic Block Observer (CBILBO); Modeling Power-Supply Disturbances in Digital Circuits; and Design of CMOS VLSI Circuits for Testability.

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Document Details

Document Type
Technical Report
Publication Date
Mar 01, 1986
Accession Number
ADA184364

Entities

Organizations

  • Stanford University

Tags

Communities of Interest

  • Advanced Electronics
  • Autonomy
  • Energy and Power Technologies

DTIC Thesaurus Topics

  • Cell Structure
  • Circuits
  • Computer Science
  • Computer-Aided Design
  • Computers
  • Detectors
  • Digital Circuits
  • Electrical Engineering
  • Engineering
  • Industrial Plants
  • Logic
  • Logic Gates
  • Metastable State
  • Power Supplies
  • Shift Registers
  • Simulations
  • Systems Engineering

Fields of Study

  • Engineering
  • Physics

Readers

  • Integrated Circuit Design and Technology.
  • Theoretical Analysis.