Precise Measurement of Refractive Index and Absorption Coefficient of Near Millimeter Wave and Far Infrared Materials.
Abstract
A quasi-optical technique, namely, dispersive Fourier transform spectrometry, has now been improved to provide high-precision continuous data of complex refractive index, complex dielectric permittivity and loss tangent of materials and complex magnetic permeability of ferrite materials at millimeter and submillimeter wavelengths. The use of a polarizing two beam interferometric technique allowed a broad frequency coverage in particularly between 6mm and 0.5mm range. Non-polar polymers such as polyethylene and teflon exhibit extremely low-loss characteristics in the entire millimeter wavelength range.
Document Details
- Document Type
- Technical Report
- Publication Date
- Jun 01, 1987
- Accession Number
- ADA184538
Entities
People
- Kenneth J. Button
- Mohammed N. Afsar
Organizations
- Massachusetts Institute of Technology