Short Pseudorandom Test Sequences.
Abstract
This paper presents a probabilistic model for pseudorandom testing of combinational circuits and shows how the general model can be simplified for short test sequences. Pseudorandom test pattern generation uses an autonomous linear feedback shift register, ALFSR, as a source of test vectors. These test vectors can be, and are, used to test both combinational and sequential networks. Only combinational circuit testing is considered here. This discussion applies mainly to on-line testing in which the test patterns are generated during the test procedure rather than being stored copies of previously generated patterns. The difference is that all of the first L vectors in the sequence must be used rather than selected patterns. The patterns may be generated by circuits or by a program simulating an ALFSR. The major current issues for pseudorandom test pattern generation are: selecting the test length, determining the fault coverage, and identifying 'random-pattern resistant' faults (faults that are hard-to-detect with random patterns). These could, in principle, all be accomplished by a full single-stuck fault simulation of the network to be tested.
Document Details
- Document Type
- Technical Report
- Publication Date
- Feb 01, 1987
- Accession Number
- ADA185883
Entities
People
- E. J. Mccluskey
- K. D. Wagner
Organizations
- Stanford University