Investigation of Microstructural Factors That Cause Low Fracture Toughness in Silicon Carbide Whisker/AL Alloy Composites.

Abstract

This investigation deals with factors influencing the fracture toughness in silicon carbide whisker aluminum alloy composites. There is an enormous amount of variables which can, independently or in combination, yield different properties in these materials. Chemical composition, manufacturing techniques and processing, along with the material's history, must all be considered for a complete understanding of the material's behavior. The approach employed here is to evaluate strength parameters in order to gauge the effectiveness of one variable, individually altered, while all other variables remain constant. For example, ultimate tensile strength was one parameter measured before and after a certain heat treatment. Any observed changes in strength were then investigated on a microstructural level, using electron microscopy and x-ray techniques. Ideally, an explanation for the phenomenon can be found and a model proposed to explain or predict the behavior. Keywords: Silicon carbide whiskers, Composites, Microstructure, Thermomechanical treatments.

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Document Details

Document Type
Technical Report
Publication Date
Sep 01, 1987
Accession Number
ADA186443

Entities

People

  • C. R. Harris
  • F. E. Wawner

Organizations

  • University of Virginia

Tags

Communities of Interest

  • Advanced Electronics
  • Biomedical
  • Space

DTIC Thesaurus Topics

  • Advanced Materials
  • Ceramic Materials
  • Composite Materials
  • Cooperative Engagement Capability
  • Electron Microscopes
  • Electron Microscopy
  • Engineering
  • Failure Mode And Effect Analysis
  • Materials
  • Materials Engineering
  • Materials Science
  • Materials Testing
  • Microscopy
  • Particles
  • Silicon Carbide
  • Tensile Strength
  • Tensile Testing

Fields of Study

  • Materials science

Readers

  • Economics
  • Powder metallurgy of Titanium alloys.
  • Regression Analysis.

Technology Areas

  • Microelectronics