The Magic of Carrier Patterns in Moire Interferometry,
Abstract
Practical applications in which carrier patterns are used with moire interferometry for strain measurements are presented. Examples of typical experimental analyses illustrate how moire carrier patterns are applied to obtain the desired data in complex laminated composite specimens. In many cases, carrier patterns permit extraction of much more detailed information, with procedures that are easier and more accurate than those using load-induced fringes alone. In moire interferometry, the carrier patterns can be introduced easily by adjustments of optical elements that control the virtual reference grating.
Document Details
- Document Type
- Technical Report
- Publication Date
- Aug 01, 1987
- Accession Number
- ADA187582
Entities
People
- D. Post
- R. Czarnek
- Yuanyuan Guo
Organizations
- Virginia Tech