Apparatus for the Study of Silicon Film Deposition and Silicon Etching.
Abstract
A special vacuum system used to study the surface reactions in thin film deposition and etching was equipped with surface analytical techniques and ion sputtering for preparing and characterizing surfaces. X-ray and ultraviolet photoelectron spectroscopy systems were obtained from Vacuum Science Workshop and installed in a 2-chamber vacuum system along with an ion sputtering gun for sample cleaning. These techniques will be used in conjunction with infrared ellipsometry and modulated molecular beam techniques to elucidate the kinetics and mechanisms of surface reactions of silicon deposition and etching.
Document Details
- Document Type
- Technical Report
- Publication Date
- Jul 31, 1987
- Accession Number
- ADA187616
Entities
People
- Jay Benziger
Organizations
- Princeton University