Trace Analysis by MS/MS on a Double Focussing Mass Spectrometer,
Abstract
Recent advances in mass spectrometry - mass spectrometry (ms/ms) indicate that this techniques has a number of advantages over conventional methods for identification and trace analysis of organic materials (1). The method involves detection of fragment or daughter ions which arise from spontaneous or collisionally activated decomposition of parent ions in a field free region of the spectrometer. The main advantages are the additional information provided in the form of generic relationships between ions in the mass spectrum and the high specificity which can be achieved. In many cases, data obtained by ms/ms is sufficient to differentiate between isomeric structures. Although the ion intensity observed by ms/ms methods is considerably lower than with conventional MS, the reduction in 'chemical noise' is generally sufficient to allow detection of compounds at low levels by direct mixture analysis.
Document Details
- Document Type
- Technical Report
- Publication Date
- May 01, 1987
- Accession Number
- ADA187954
Entities
People
- A. G. Moritz
- V. T. Borrett
Organizations
- Defence Science and Technology Group