Study of Electronic Transport and Breakdown in Thin Insulating Films
Abstract
Recent progress is reported in an ongoing program of studies of high- field and radiation effect in thin insulating films on semiconducting substrates. The investigations reported here include the generation of interface states in the Si-Si02 system by the photoinjection of electrons and by Fowler- Nordheim tunneling of electrons, and a study of radiation-induced interface states. Keywords: Insulating films, Electronic transport, Insulators, Charge trapping, Dielectric breakdown, Silicon dioxide.
Document Details
- Document Type
- Technical Report
- Publication Date
- Jun 01, 1980
- Accession Number
- ADA187999
Entities
People
- Walter C. Johnson
Organizations
- Princeton University