Plasma Deposition of Silicon Carbide Thin Films.

Abstract

This report summarizes the work performed on a three year program to obtain an understanding of deposition processes of thin films from plasmas. Deposition plasmas of methane and of methane-hydrogen and methane-silane mixtures were characterized via electrical, optical, and mass spectroscopic measurements. Surface chemical studies of the fundamental surface reactions were performed, and a model was constructed which takes into account both gas phase and the surface processes leading to deposition. The properties of the deposited films were related to the plasma conditions associated with their deposition. Advances in process modeling and surface chemical techniques were achieved on this program, in addition to the knowledge that was gained about the specific plasma deposition processes that were studied.

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Document Details

Document Type
Technical Report
Publication Date
Aug 20, 1987
Accession Number
ADA188093

Entities

People

  • John Yates
  • L. E. Kline
  • Michael J. Bozack
  • W. D. Partlow
  • W. J. Choyke

Tags

Communities of Interest

  • Advanced Electronics

DTIC Thesaurus Topics

  • Air Force
  • Chemical Reactions
  • Chemistry
  • Compound Semiconductors
  • Films
  • Materials
  • Materials Science
  • Measurement
  • Optical Properties
  • Optics
  • Refractive Index
  • Silicon Carbide
  • Spectra
  • Spectroscopy
  • Surface Chemistry
  • Surface Reactions
  • Thin Films

Readers

  • Systems Analysis and Design
  • Thin Film Deposition Science.