The Magnitude of Secondary Electron Contributions in Photon Stimulated Desorption.

Abstract

Recent reports on the extent of secondary electron contributions in electron/photon stimulated desorption (ESD/PSD) appear to be contradictory. JAEGER et al. suggested that secondary electrons provide the dominant contribution to the H+ yield from NH3/Ni and called the process x-ray induced ESD (XESD). Others have concluded that the XESD process is the dominant mechanism in the PSD of N+ and O+ ions from the mixed condensed gases such as N2 and O2 and in the PSD of H+ ions from OH/YbO-Sm. On the other hand, considerable evidence exists in the literature for the dominance of the direct photon excitation mechanisms. This paper presents a re-examination of the three systems mentioned above where a dominant XESD effect has been postulated to determine the validity of the conclusions previously reached. Keywords: Electra simulated desorption; Photon stimulated desorption; Secondary electrons.

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Document Details

Document Type
Technical Report
Publication Date
Dec 01, 1987
Accession Number
ADA189094

Entities

People

  • David E. Ramaker
  • Hideo Sambe
  • R. L. Kurtz
  • T. E. Madey

Organizations

  • George Washington University

Tags

Communities of Interest

  • Materials and Manufacturing Processes

DTIC Thesaurus Topics

  • Department Of Veterans Affairs
  • Desorption
  • Electrons
  • Excitation
  • Literature
  • Tank Guns
  • X Rays

Readers

  • Molecular Photonics/Laser Physics
  • Pulsed Power and Plasma Physics.
  • Theoretical Analysis.

Technology Areas

  • Microelectronics