Joint Services Electronics Program. Appendix.
Abstract
Partial contents: Optical detection of charge modulation in silicon integrated circuits using a laser diode probe; Observation of dislocations in graphite by scanning tunneling microscopy (STM); Atomic resolution imaging of a nonconductor by atomic force microscopy; A real-time confocal scanning optical microscope; Switchable fiber optic using the acousto-optic bragg interaction and using acoustic transducers deposited upon the fiber surface; All-fiber-optic gyroscopes; Deposition of piezoelectric films on single mode fibers and applications to fiber modulators; Optical sensors for range and depth measurements; Images of a lipid bilayer at molecular resolution by STM; Real time digital signals in a silicon bipolar junction transistor using a noninvasive optical probe; Anomalous distance dependence in STM; Monolithic Nd:YAG fiber laser; Optical interactions with solids; Noninvasive sheet charge density probe for integrated silicon devices; Deposition of oriented zinc oxide on an optical fiber; Low loss single crystal sapphire optical fibers; Electrooptic sampling in GaAS integrated circuits; A guided wave monolithic resonator ruby fiber laser; Tunneling microscopy from 300 to 4.2k; Characterization of proton exchanged waveguides in MgO:LiNbO (sub) 3; High speed, High resolution fiber diameter measurement system.
Document Details
- Document Type
- Technical Report
- Publication Date
- Oct 15, 1987
- Accession Number
- ADA189143
Entities
People
- Calvin Quate
- D. M. Bloom
- Gordon S. Kino
- Herbert John Shaw
- R. L. Byer
Organizations
- Stanford University