An Instrument for Advanced Material Microstructure Analysis

Abstract

Development and evaluation of a Scintillator Fiber-optic Reticon Detector array (SFRD) for application to a high-resolution computed tomography (CT) instrument, or Tomoscope, has been carried out. The objectives were to develop cryogenic cooling and electronic control and amplification to improve the detector noise performance and to evaluate the thermal, electronic and X-ray performance of the detector package. The thermoelectric cryostat was developed with a temperature floor of -70 C and typical drift of 0.1 C/min. The electronic control allows computer adjustment of integration time between .18 and 350 seconds. The preamplifier demonstrated RMS noise of order 1000 electrons, though the overall system noise was significantly higher. X-ray testing demonstrated detector resolution better than 50-microns FWHM. The Tomoscope will be a valuable instrument for NDE evaluations, aerospace materials and components. In particular, for inspection of internal structure and damage of materials used in turbine blades, vanes and disks. It will be useful for better understanding of fabrication, failure modes and for final component inspections.

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Document Details

Document Type
Technical Report
Publication Date
Jun 01, 1986
Accession Number
ADA189389

Entities

People

  • J. A. Smith
  • J. J. Lepage
  • R. A. Hamstra

Tags

Communities of Interest

  • Advanced Electronics
  • Space

DTIC Thesaurus Topics

  • Advanced Materials
  • Air Force
  • Corporations
  • Detection
  • Detectors
  • Failure Mode And Effect Analysis
  • High Resolution
  • Materials
  • Materials Laboratories
  • Performance Tests
  • Procurement
  • Quantum Efficiency
  • Signal Processing
  • Test And Evaluation
  • Turbines
  • United States
  • X Rays

Fields of Study

  • Physics

Readers

  • Computer Science/Computer Engineering/Data Science/Digital Signal Processing.
  • Image Processing and Computer Vision.
  • Structural Health Monitoring of Composite Structures.

Technology Areas

  • Microelectronics
  • Microelectronics - Microelectromechanical Systems
  • Space