Fundamental Studies and Device Development in Beta Silicon Carbide.
Abstract
The research of this reporting period has involved (1) the chemical vapor deposition (CVD) of Beta-silicon carbide on off-axis silicon (100), (2) the growth of Beta- and alpha-SiC on monocrystalline alpha-SiC substrates, (3) high temperature ion implantation, and damage production studies, (4) the continued development of contacts for n- and p-type SiC, (5) reactive ion and plasma etching, and (6) the fabrication and evaluation of MESFETs and MOSFETs in Bet-SiC. Keywords: Doping; Aluminum nitride; Electron microscopy; Secondary ion mass spectroscopy; Rutherford back-scattering.
Document Details
- Document Type
- Technical Report
- Publication Date
- Aug 31, 1987
- Accession Number
- ADA189540
Entities
People
- Calvin H. Carter Jr.
- Jeffrey T Glass
- Robert F Davis
Organizations
- North Carolina State University