Detecting Bridging Faults with Stuck-at Test Sets.

Abstract

Simulations run on sample circuits show that extremely high detection of bridging faults is possible using modifications of psuedo-exhaustive test sets. Real chips often contain bridging faults, and this research shows that stuck-at test sets are not sufficient for detecting such faults. The modified pseudo-exhaustive test sets are easy to generate and require little, or no, fault simulation. Criteria have been found for identifying bridging faults unlikely to be detected by test sets. Techniques for increasing the bridging fault coverage of test sets without consuming excessive computer time are suggested. Keywords: Bridging faults, stuck-at faults, pseudo-exhaustive test, fault modeling, fault tolerant computing.

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Document Details

Document Type
Technical Report
Publication Date
Dec 01, 1987
Accession Number
ADA190141

Entities

People

  • Edward J. Mccluskey
  • Steven D. Millman

Organizations

  • Stanford University

Tags

Communities of Interest

  • Advanced Electronics

DTIC Thesaurus Topics

  • Circuits
  • Computer Programming
  • Computer Science
  • Computers
  • Demographic Cohorts
  • Detection
  • Electrical Engineering
  • Engineering
  • Feedback
  • Logic
  • Military Research
  • Oscillation
  • Simulations
  • Simulators
  • Strategic Defense Initiative
  • Test Sets
  • Universities

Fields of Study

  • Engineering

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