Micro-Raman Analysis of Dielectric Optical Thin Films.

Abstract

Wide-band-gap dielectric thin films up to 6 micrometer in thickness are characterized by spontaneous and stimulated Raman-gain microscopy. Materials surveyed are Aluminum oxide, Yttrium oxide, Zirconium oxide, Hafnium oxide, and Tantalum oxide. 1-micrometer sized surface defects on Y2O3 are investigated.

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Document Details

Document Type
Technical Report
Publication Date
Jan 07, 1988
Accession Number
ADA191228

Entities

People

  • Ansgar Schmid

Organizations

  • University of Rochester

Tags

Communities of Interest

  • Advanced Electronics

DTIC Thesaurus Topics

  • Brushless Dc Motors
  • Diffraction
  • Dye Lasers
  • Films
  • Laser Applications
  • Laser Beams
  • Lasers
  • Liquid Dye Lasers
  • Materials
  • Measurement
  • Nonlinear Optics
  • Raman Scattering
  • Raman Spectra
  • Scattering
  • Spectra
  • Spectroscopy
  • Thin Films

Fields of Study

  • Physics

Readers

  • Materials Science and Engineering.
  • Thin Film Deposition Science.