Compilation of Preprints.

Abstract

Contents: Circuit Segmentation for Pseudo-Exhaustive Testing Via Simulated Annealing; Probability Models for Pseudorandom Test Sequence; and Built-In Self-Tewt for Sequential Machines. Keywords: Heuristic approximation algorithm; Combinatorial circuits; Circuit testers.

Document Details

Document Type
Technical Report
Publication Date
Jun 01, 1987
Accession Number
ADA191246

Entities

Organizations

  • Stanford University

Tags

DTIC Thesaurus Topics

  • Algorithms
  • Annealing
  • Circuit Testers
  • Circuits
  • Computer Vision
  • Mathematics
  • Networks
  • Probability
  • Sequences

Readers

  • Computer Engineering
  • Computer Programming and Software Development.
  • Operations Research