Monte Carlo Analysis of Lateral Collection Diode Arrays.

Abstract

The determination of the thermally generated, diffusion limited leakage current density of lateral collection diode arrays is not possible analytically except for those with the simplest of geometries. It is shown here how the simulation of a spot-scan experiment, using a Monte Carlo analysis, can be used to determine the leakage current density of an array of any geometry. In particular, it is used to analyse a diode array of hexagonal symmetry as a function of array geometry and bulk diffusion length. The analysis shows that the leakage current of a diode may be substantially reduced by the presence of nearby reverse-biased diodes.

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Document Details

Document Type
Technical Report
Publication Date
Oct 01, 1987
Accession Number
ADA191890

Entities

People

  • A. M. White
  • A. P. Davis

Organizations

  • Royal Signals and Radar Establishment

Tags

Communities of Interest

  • Materials and Manufacturing Processes

DTIC Thesaurus Topics

  • Current Density
  • Demographic Cohorts
  • Diffusion
  • Diodes
  • Efficiency
  • Equations
  • Errors
  • Excitation
  • Geometry
  • Mean Free Path
  • Minority Groups
  • Probability
  • Random Walk
  • Simulations
  • Symmetry
  • Two Dimensional

Fields of Study

  • Physics

Readers

  • Phased Array Antenna Design.
  • Semiconductor Device Technology
  • Statistical inference.