Stress Corrosion of Ceramic Materials.
Abstract
Environmentally enhanced crack growth data was obtained for GaAs in a number of chemical environments. The effectiveness of particular environments was predicted on the basis of existing crack growth models. No environment was found to produce crack growth in silicon. Dielectric aging studies were conducted on capacitor ceramics. A correlation was shown between decreases in dielectric constant and reductions in indentation strength at small indentation loads. Keywords: Crack growth, Fracture, Stress corrosion, Ceramics, Silicon, Gallium arsenide, Capacitors, Dielectric aging.
Document Details
- Document Type
- Technical Report
- Publication Date
- Jan 10, 1988
- Accession Number
- ADA191979
Entities
People
- Anna M. Wilson
- G. S. White
- M. L. Balmer
- S. W. Freiman
- T. R. Palamides
Organizations
- National Institute of Standards and Technology