Picosecond Optoelectronic Sampling of Electrical Waveforms Produced by an Optically Excited Field Effect Transistor.

Abstract

Picosecond optoelectronic techniques were used to measure the electrical response of a submicron gate GaAs FET to optical excitation by picosecond laser pulses. Results indicated that carrier transport in these devices is strongly affected by screening of the applied electrical bias at high optical excitation levels. The use of these devices as ultrafast photodetectors and as generators of ultrafast transient electrical waveforms on GaAs integrated circuits was discussed.

Document Details

Document Type
Technical Report
Publication Date
Dec 30, 1987
Accession Number
ADA192384

Entities

People

  • Steven C. Moss

Organizations

  • The Aerospace Corporation

Tags

DTIC Thesaurus Topics

  • Excitation
  • Field Effect Transistors
  • Generators
  • Integrated Circuits
  • Laser Pulses
  • Picosecond Time
  • Transistors
  • Waveforms

Fields of Study

  • Physics

Readers

  • Integrated Circuit Design and Technology.
  • Optical Physics and Photonics.
  • Semiconductor Device Technology

Technology Areas

  • Directed Energy
  • Microelectronics