Attachable Interferometric Strain Gages.
Abstract
Laser based interferometry from tiny reflective indentations can be used to measure in-plane strain/displacement over a very short gage length (on the order of 100 um). If the specimen material is not reflective, then some other means of generating the interference patterns must be found. This report describes two kinds of attachable gages: plated acetate replicas of indentations and reflective foils that are indented after application. In either case, the gage is applied with the techniques used for foil resistance gages and the gage itself is very small. The manufacturing procedures are described. Keywords: Strain measurement, Interferometry, Short gage length.
Document Details
- Document Type
- Technical Report
- Publication Date
- Feb 01, 1988
- Accession Number
- ADA192390
Entities
People
- K. C. Wang
- William N. Sharpe Jr.
Organizations
- Johns Hopkins University