A Study of Electronic Transport and Breakdown in SiO2.

Abstract

Transport of electrons in silicon dioxide, at high electric fields, has been of much interest for quite some time. In spite of this, the role of various scattering processes has not yet been sorted out. At low fields, electrons show a mobility in the 20-30 sq. cm/V-sec range, and at high fields (of the order of 1 MV/cm) begin to exhibit hot carrier effects. The polar modes are the dominant electron scatterers for fields up to 1.5-2 MV/cm, and beyond this, runaway begins to occur. Experimentally, it is found that the electron distribution function stabilizes at an average energy around 3 eV for fields above 3 MV/cm, which requires the onset of additional scattering processes. The current understanding of the transport and scattering processes is reviewed. In particular, the role of Umklapp processes, and intervalley processes, is discussed. Calculations utilizing an ensemble Monte Carlo technique are used to study the various processes.

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Document Details

Document Type
Technical Report
Publication Date
Mar 01, 1988
Accession Number
ADA194258

Entities

People

  • D. K. Ferry

Organizations

  • Arizona State University

Tags

Communities of Interest

  • Advanced Electronics

DTIC Thesaurus Topics

  • Band Gaps
  • Band Structures
  • Conduction Bands
  • Crystal Lattice Vibrations
  • Crystal Lattices
  • Crystal Structure
  • Electric Fields
  • Electronics
  • Electrons
  • Energy Bands
  • High Energy
  • Materials
  • Mobility
  • Phonons
  • Semiconductors
  • Silicon Dioxide
  • Solid State Electronics

Fields of Study

  • Materials science

Readers

  • Electromagnetic Wave Scattering and Antenna Radiation Engineering
  • Mathematics or Statistics
  • Semiconductor Device Technology

Technology Areas

  • Microelectronics