Recent Trends in Parts SEU (Single Event Upset) Susceptibility from Heavy Ions.
Abstract
JPL and Aerospace have collected an extensive set of heavy ion single event upset (SEU) test data since their joint publication in December 1985. This report presented trends in SEU susceptibility for state-of-the-art parts. An ongoing single event upset (SEU) program at JPL and the Aerospace Corporation is continuing in order to assess specific parts performance in interplanetary and satellite environments and to establish trends in SEU response of many parts types. In 1985, Nichols et al (Ref. 1) published a nearly comprehensive listing of SEU test data for 186 parts. This large collection was sufficient to permit generalizations about the parts SEU susceptibility according to their technology, function, and manufacturer. In this report generalizations are extended to newer classes of parts and the statistical base for some of the previous parts classifications is expanded.
Document Details
- Document Type
- Technical Report
- Publication Date
- Mar 25, 1988
- Accession Number
- ADA194610
Entities
People
- D. K. Nichols
- L. S. Smith
- Rokutano Koga
- W. A. Kolasinski
- W. E. Price
Organizations
- The Aerospace Corporation