Burn-in with Mixed Populations

Abstract

Any electronic component may be either perfect or defective. The lifetime distributions of both types are assumed known. We assume that perfect items never fail. Before being used, each production lot is tested to eliminate some of its defectives, i.e., the lot is subjected to burn-in. Here, the purpose of burn-in is to ensure with a given confidence level that an item chosen randomly from the test survivors has a given probability of operating properly for a given time period. Three procedures are considered. Small sample theory is investigated for various assumptions about the information available concerning the number of defectives by using both analytic techniques and simulation. Large sample theory is studied, as well. This study shows that the first two procedures are sensitive to the number of defective items assumed and the performance of the third procedure is not. Keywords: Burn-in; Sequential stopping; Reliability; Mixed populations.

Open PDF

Document Details

Document Type
Technical Report
Publication Date
Aug 01, 1987
Accession Number
ADA194651

Entities

People

  • Saul Blumenthal
  • Un-quei W. Pan

Organizations

  • Ohio State University

Tags

Communities of Interest

  • Advanced Electronics
  • Materials and Manufacturing Processes

DTIC Thesaurus Topics

  • Algorithms
  • Boundaries
  • Computational Science
  • Data Science
  • Distribution Functions
  • Electronic Components
  • Electronic Equipment
  • Estimators
  • Information Science
  • Order Statistics
  • Probability
  • Production
  • Random Variables
  • Semiconductor Devices
  • Semiconductors
  • Simulations
  • Statistics

Fields of Study

  • Mathematics

Readers

  • Computational Modeling and Simulation
  • Electrical Engineering
  • Logistics and Supply Chain Management.

Technology Areas

  • Microelectronics