Piezoelectric and Electrostrictive Materials for Transducer Applications. Volume 2.

Abstract

A modified Michelson interferometer is used to study the strain properties of piezoelectric and electrostrictive materials. For small displacement, a feedback loop is introduced to stabilize the system against the low frequency optical path-length drifting and the system is capable of resolving displacements of the order of .001 A. For the strain induced by domain switching a dual-channel signal detection scheme is used which automatically reads out the displacement of the sample. The effect on the measurement of the sample bonding to a substrate and other related problems are discussed.

Open PDF

Document Details

Document Type
Technical Report
Publication Date
Mar 01, 1988
Accession Number
ADA194956

Entities

People

  • G. R. Barsch
  • J. V. Biggers
  • Leslie Eric Cross
  • Robert E. Newnham

Organizations

  • Pennsylvania State University

Tags

Communities of Interest

  • Advanced Electronics

DTIC Thesaurus Topics

  • Ceramic Materials
  • Computer Programs
  • Crystal Structure
  • Detection
  • Detectors
  • Dielectric Permittivity
  • Dielectric Properties
  • Dielectrics
  • Diffraction
  • Materials
  • Materials Science
  • Measurement
  • Phase Transformations
  • Signal Detection
  • Three Dimensional
  • Transition Temperature
  • Waveplates

Readers

  • Computer Science.
  • Materials Science and Engineering.
  • Spectroscopy.