Fast On-Chip Delay Estimation for Cell-Based Emitter Coupled Logic,

Abstract

The goal of this work is to produce fast, but accurate, estimates of best and worst case delay for on-chip emitter coupled logic (ECL) nets. The work consists of two major parts: (1) macromodelling of ECL logic gates acting as both sources and loads; and (2) delay estimation for individual nets using the gate macromodel parameters and RC tree models for metal interconnect. Both of the above functions (gate macromodeling and delay estimation) have been extensively tested on an industrial ECL process and cell (i.e., logic gate) library. The success of a macromodelling approach relies on repetitive use of members of a library of modelled cells. A fixed computational cost (several c.p.u. hours per cell) is paid to obtain simplified macromodel parameter values. Resultant timing estimates are typically within 5-10% of SPICE and are obtained roughly three orders of magnitude more quickly than SPICE.

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Document Details

Document Type
Technical Report
Publication Date
Feb 01, 1988
Accession Number
ADA195150

Entities

People

  • James M. Pierce
  • John L. Wyatt Jr.
  • Peter R. O'brien
  • Thomas L. Savarino

Organizations

  • Massachusetts Institute of Technology

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  • Materials and Manufacturing Processes

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  • Logic
  • Logic Gates
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