Heavy Ion and Proton Tests for Subsystem Upset.
Abstract
This report describes the results of heavy ion and proton tests for upset in a CMOS/SOS subsystem ALU (Arithmetic Logic Unit) which is part of a spacecraft computer. Provided are an iron spectrum with a maximum LET of 83 MeV-cm2/mg at normal incidence. Protons of 180-MeV energy and 10-microsec pulsewidths were obtained at the Brookhaven REF facility. Peak proton dose rates of 7.9E9 rad/s were delivered by micropulses of 1-ns width and with a period of 5 ns. Results showed that the ALU operated without upset during both heavy ion tests. However, functional failure of microprocessor devices occurred during proton irradiations; whereas RAM and MXR (Microprogram Controller and Sequencer) parts were not upset. A single pulse of 119 krads (Si) caused upset of the microprocessor, but multiple pulse doses of 19 to 60 megarads did not upset the RAM and MXR, respectively.
Document Details
- Document Type
- Technical Report
- Publication Date
- Mar 21, 1988
- Accession Number
- ADA195267
Entities
People
- G. J. Brucker
- J. Boross
- J. Patella
- M.A. Xapsos
- P. Oey