Automatic Prober for the DC Characterisation of Gallium Arsenide Devices. Part 2. The Data Sorting and Display Facility.
Abstract
The Automatic Device Probing System used in the Microwave Devices Division (DP2) comprises separate measurement and data handling facilities. The measurement facility is described in RSRE Memorandum 4065 and the data sorting and display facility forms the subject of this memorandum. The facility described is designed to assist in analysing the large quantity of measured data obtained from device wafers and allows general trends as well as individual device parameters to be investigated. Programs have been written to produce maps which allow parameter variations across wafers to be assessed and additional routines are available which present the data in histogram form. These options allow the numeric as well as the geographic distribution of the data to be investigated. Three main types of map display are available, these display the variation in magnitude of a device parameter across a wafer, the location and nature of the failure of any failed devices and the location of devices with a specified combination of parameters.
Document Details
- Document Type
- Technical Report
- Publication Date
- Jul 01, 1987
- Accession Number
- ADA195408
Entities
People
- B. E. Avery
- B. T. Hughes
Organizations
- Royal Signals and Radar Establishment