Application of Nondestructive Testing Techniques to Materials Testing.

Abstract

A set of new techniques in scanning acoustic and optical microscopy is described. Starting with an acoustic microscope that can directly measure both phase and amplitude, similar techniques have been developed for the scanning optical microscope. These make it possible to measure range to a thousandth of a wavelength. Other techniques involving scanning optical microscopy have been demonstrated which make it possible to carry out profiling of semiconductor circuits. Developments of these methods are now being actively pursued for use in the semiconductor industry. Developments of acoustic technology pioneered on this program have proved extremely important for measuring internal defects in composites and surface cracks on ceramics. Keywords: Aircraft, Composite Materials, Ceramics, Integrated circuitry, Structural members, Phase measurement, Metal films, Epoxy compounds, Fiber optics. JES

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Document Details

Document Type
Technical Report
Publication Date
Dec 01, 1987
Accession Number
ADA195716

Entities

People

  • Gordon S. Kino

Organizations

  • Stanford University

Tags

Communities of Interest

  • Advanced Electronics
  • Air Platforms
  • Sensors

DTIC Thesaurus Topics

  • Acoustic Waves
  • Ceramic Materials
  • Composite Materials
  • Confocal Microscopy
  • Detection
  • Detectors
  • Materials Laboratories
  • Materials Processing
  • Materials Science
  • Materials Testing
  • Measurement
  • Optics
  • Range Finding
  • Repetition Rate
  • Semiconductors
  • Surface Acoustic Waves
  • Transducers

Fields of Study

  • Physics

Readers

  • Materials Science (Mechanical Engineering).
  • Quantum Dot Semiconductor Device Photonics and Graphene Optoelectronic Materials and THz Physics.
  • Reinforced Composite Materials

Technology Areas

  • Microelectronics