Control Electronics for Atomic Force Microscopy
Abstract
We describe the control electronics for our Atomic Force Microscope (AFM). The set of electronic devices described here allow convenient operation of an Atomic Force Microscope. The key device is the Force Controller, which automates the otherwise tedious and time consuming readjustment of the force to a preset value by controlling two gated feedback loops. The preset value of the force can be easily changed by simply turning a potentiometer. This automated system allows us to obtain reliable data, with known force 4s, despite piezoelectric creep and thermal drift in the force determining mechanical setup. The electronic devices and concepts presented here work for AFM's that use tunneling, capacitance measurements or optical interference to sense small deflections of the spring as(150 nm)squared can be easily prepared in air by melting a gold wire with an oxyacetylene torch. Features with characteristic dimensions as low as 10 nm can be written and observed on these terraces with a Scanning Tunneling Microscope (STEM). Control electronics; Spring.
Document Details
- Document Type
- Technical Report
- Publication Date
- Jun 01, 1988
- Accession Number
- ADA196163
Entities
People
- O. Marti
- Paul K. Hansma
- S. Gould
Organizations
- University of California, Santa Barbara