Atomic Force MIcroscopy and Scanning Tunneling Microscopy with a Combination Atomic Force Microscope/Scanning Tunneling Microscopy

Abstract

Since almost all the electronic and mechanical requirements for an atomic force microscope (AFM) are the same as for a scanning tunneling (STM), it is convenient and practical to build a combination AFM/STM with interchangeable heads. The conversion from one to the other can be made in a few minutes. Representative images demonstrate that atomic resolution can be obtained in both modes of operation. With the two modes of operation, it can image conductors, semiconductors, and insulators.

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Document Details

Document Type
Technical Report
Publication Date
Jun 01, 1988
Accession Number
ADA196770

Entities

People

  • B. Drake
  • O. Marti
  • Paul K. Hansma
  • S. Gould

Organizations

  • University of California, Santa Barbara

Tags

Communities of Interest

  • Advanced Electronics
  • Sensors

DTIC Thesaurus Topics

  • Abstracts
  • Assembly
  • California
  • Classification
  • Conversion
  • Diameters
  • Dielectrics
  • Electrodes
  • Fabrication
  • Frequency
  • Microscopes
  • Microscopy
  • Monomolecular Films
  • Resonant Frequency
  • Semiconductors
  • Tungsten
  • United States

Fields of Study

  • Physics

Readers

  • Nanoscale Plasmonic Nanotechnology
  • Software Engineering
  • Thin Film Deposition Science.

Technology Areas

  • Microelectronics
  • Microelectronics - Graphene