How Miniature/Microminiature (2M) Repair Capabilities Can Reduce the Impact of No Evidence of Failure (NEOF) Among Repairables on the Navy's Operations and Maintenance Account
Abstract
Today with technical advances and cost reductions in electronics, it has become possible to recategorize many Field Level Repairable (FLRs) and Depot Level Repairable (DLRs) as progressive repairables. This thesis covers the growing problem of No Evidence of Failure (NEOF) among repairables and how Miniature/Microminiature (2M) repair capability can be used to correct this problem. The major objective is to demonstrate how 2M repair capability can save O&MN funding and decrease the Repair Turnaround (RTAT) for repairables. Two NSNs were chosen from the Support and Test Equipment Engineering Program (STEEP) tests performed by SIMA San Diego during 1987. A statistical analysis and a Level of Repair Analysis (LORA) were run on both. Research was also conducted on possible changes and uses for shipboard 3-M documentation. The main conclusion of this thesis is that with proper training and implementation, 2M repair capability can save O&MN funding, decrease RTAT for both FLRs and DLRs, and enhance fleet Operational Availability (Ao).
Document Details
- Document Type
- Technical Report
- Publication Date
- Jun 01, 1988
- Accession Number
- ADA197379
Entities
People
- Robert C. Barr
Organizations
- Naval Postgraduate School