Roughness-Induced Resonance for Molecular Fluorescence Near a Corrugated Metallic Surface

Abstract

Based on a dynamical energy transfer theory for the molecular decay rate near a rough metallic surface, a new resonance structure is predicted which is mediated by the roughness and which is absent in the static image theory. The implication of this new resonance structure to other phenomena, such as electron energy loss spectrum and cross coupling in thin films, is pointed out.

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Document Details

Document Type
Technical Report
Publication Date
Jul 01, 1988
Accession Number
ADA197685

Entities

People

  • P. T. Leung
  • Thomas F. George
  • Young S. Kim

Organizations

  • University at Buffalo

Tags

Communities of Interest

  • Advanced Electronics
  • Weapons Technologies

DTIC Thesaurus Topics

  • Air Force
  • Chemical Engineering
  • Chemistry
  • Energy Transfer
  • Films
  • Frequency
  • Materials
  • Materials Science
  • Military Research
  • New York
  • Physics
  • Surface Chemistry
  • Surface Plasmon Resonance
  • Surface Plasmons
  • Thin Films
  • United States
  • United States Government

Fields of Study

  • Physics

Readers

  • Fluid Mechanics and Fluid Dynamics.
  • Plasma Physics / Magnetohydrodynamics
  • Thin Film Deposition Science.

Technology Areas

  • Microelectronics
  • Microelectronics - Graphene