Picosecond Photoconductive Sampling Measurements of the Scattering Parameters of High-Speed Field-Effect Transistors

Abstract

Described are stimulus-response measurement techniques based on the photoconductive generation and sampling of picosecond electrical pulses for measuring the high-frequency scattering parameters of high-speed microwave devices. These techniques are compared with more conventional microwave diagnostic techniques. Keywords: Gallium arsenide field-effect transistor, Microwave devices, Photoconductive sampling, Picosecond optoelectronics, Scattering parameters.

Open PDF

Document Details

Document Type
Technical Report
Publication Date
Aug 22, 1988
Accession Number
ADA197966

Entities

People

  • Duane D. Smith
  • Steven C. Moss

Organizations

  • The Aerospace Corporation

Tags

Communities of Interest

  • Advanced Electronics
  • Energy and Power Technologies

DTIC Thesaurus Topics

  • Acousto-Optic Modulators
  • Amplifiers
  • Dye Lasers
  • Electronics Laboratories
  • Field Effect Transistors
  • Frequency
  • Frequency Domain
  • Laser Pulses
  • Liquid Dye Lasers
  • Measurement
  • Power Electronics
  • Scattering
  • Semiconductor Devices
  • Semiconductors
  • Transistors
  • Transmission Lines
  • Waveforms

Fields of Study

  • Physics

Readers

  • Aerosol Science/Aerosol Physics
  • Semiconductor Device Technology

Technology Areas

  • Microelectronics