Defect Reduction in Epitaxial Growth Using Superlattice Buffer Layers

Abstract

Superlattice (SL) structures are both fundamental and technical interest. Two classes of superlattices have been investigated. In the first class, the superlattice layers have lattice parameters that closely match those of the substrate, such as in the case of the AlGaAs-GaAs and InP 0.53Ga0.47As systems. In the second class, the strained-layer superlattice (SLS) (1), the alternating layers have lattice parameters that are different by a significant amount, but the layers are thin enough that the lattice mismatch is entirely accommodated by elastically straining the layers without the generation of misfit dislocations. Keywords: Aluminum, Gallium arsenides, Indium phosphides.

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Document Details

Document Type
Technical Report
Publication Date
Jul 01, 1988
Accession Number
ADA198409

Entities

People

  • S. M. Bedair

Organizations

  • North Carolina State University

Tags

Communities of Interest

  • Advanced Electronics
  • Space

DTIC Thesaurus Topics

  • Air Force
  • Atomic Layer Epitaxy
  • Chemical Vapor Deposition
  • Crystal Structure
  • Crystals
  • Electron Microscopy
  • Epitaxial Growth
  • Flow
  • Materials
  • Molecular Beam Epitaxy
  • Optical Properties
  • Quantum Wells
  • Semiconductors
  • Silicon Carbide
  • Spectra
  • Transitions
  • Transmission Electron Microscopy

Fields of Study

  • Materials science

Readers

  • Semiconductor Device Technology

Technology Areas

  • Microelectronics