Mechanical Reliability of Piezoelectric and Dielectric Ceramics
Abstract
Mechanical Reliability of various piezoelectric and dielectric ceramic materials has been investigated with respect to material anisotropy and operational environments. A variety of fracture mechanics testing techniques have been employed to characterize subcritical crack growth in multilayer PZT and multilayer Z5U capacitors. Subcritical crack growth is extremely sensitive to environment (chemical and electrical) as well as geometrical anisotropy of the multilayer structures. Keywords: Crack propagation, Fracture toughness, Multilayer dielectrics.
Document Details
- Document Type
- Technical Report
- Publication Date
- Jun 01, 1988
- Accession Number
- ADA198458
Entities
People
- B. G. Koepke
- K. D. Mchenry
Organizations
- Honeywell International, Inc.