Mechanical Reliability of Piezoelectric and Dielectric Ceramics

Abstract

Mechanical Reliability of various piezoelectric and dielectric ceramic materials has been investigated with respect to material anisotropy and operational environments. A variety of fracture mechanics testing techniques have been employed to characterize subcritical crack growth in multilayer PZT and multilayer Z5U capacitors. Subcritical crack growth is extremely sensitive to environment (chemical and electrical) as well as geometrical anisotropy of the multilayer structures. Keywords: Crack propagation, Fracture toughness, Multilayer dielectrics.

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Document Details

Document Type
Technical Report
Publication Date
Jun 01, 1988
Accession Number
ADA198458

Entities

People

  • B. G. Koepke
  • K. D. Mchenry

Organizations

  • Honeywell International, Inc.

Tags

Communities of Interest

  • Advanced Electronics
  • Air Platforms

DTIC Thesaurus Topics

  • Ceramic Materials
  • Composite Materials
  • Dielectric Permittivity
  • Dielectrics
  • Fatigue Tests (Mechanics)
  • Fracture (Mechanics)
  • Geometry
  • Materials
  • Materials Processing
  • Materials Science
  • Materials Testing
  • Mechanical Properties
  • Mechanical Working
  • Mechanics
  • Phase Transformations
  • Piezoelectric Materials
  • Regression Analysis

Fields of Study

  • Physics

Readers

  • Materials Science (Mechanical Engineering).
  • Materials Science and Engineering.