Final Report for American Society for Engineering Education N00014-88-J-1072
Abstract
In the initial research proposal submitted to ASEE/ONT it was proposed that Fourier Transform Spectroscopy (FTS), Auger Electron Spectroscopy (AES) and X-ray Photoelectron Spectroscopy (XPS) be used investigate the process of oxidation. These techniques would also be used to characterize the oxides that form on the surface of metals and metallic films. This surface oxidation process can lead to reduction of the infrared reflectance of the surface, changes in the electrical transport properties of the metal, and changes in the passivity of the metals, which prevents corrosion. The process by which this surface oxidation occurs and its effects on various materials is of interest to the Navy. The project was envisioned as being comprised of two related efforts, and they would proceed roughly simultaneously. Phase one was to develop the infrared devices necessary to make insitu infrared emission measurements in a gaseous environment. In Phase two, measurements of the oxidation properties of various metallic films would be made via XPS and AES.
Document Details
- Document Type
- Technical Report
- Publication Date
- Aug 22, 1988
- Accession Number
- ADA198831
Entities
People
- Arthur A. Morrish
Organizations
- American Society for Engineering Education