Electronic Interactions of Electrons, Photons, and Atoms with Material Surfaces

Abstract

The intent of this research program was to elucidate the microscopic mechanisms by which the energy of incoming beams of atoms, ions, electrons and photons is absorbed, localized and redirected to produce neutral-particle desorption from surfaces and subsequent surface modification of restructuring. The model system LiF was used, and the results compared with measurements of electronically desorbed Li-atoms adsorbed on other substrates. This study explored how the degree of surface metallization influences the choice of the final excitation state of the desorbing particle. Measurements were made to compare the desorption of excited state neutral lithium from lithium fluoride by electron, photon and ion bombardment and from lithium-dosed tungsten and lithium-dosed glass by electron and photon bombardment. In the electron and photon desorption experiments, only the first lithium resonance line is observed. These results contrast with the ion sputtering results, where emissions from higher excited states were observed. This suggests that the presence of a metal rich surface provides a channel for de-excitation of excited lithium states which are above the lithium metal Fermi energy.

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Document Details

Document Type
Technical Report
Publication Date
Aug 31, 1988
Accession Number
ADA199626

Entities

People

  • Norman H. Tolk
  • Richard F. Haglund Jr.

Organizations

  • Vanderbilt University

Tags

Communities of Interest

  • Energy and Power Technologies

DTIC Thesaurus Topics

  • Band Structures
  • Chemistry
  • Dynamics
  • Excitation
  • Fermi Levels
  • Fluorides
  • Halides
  • Ion Bombardment
  • Materials
  • Measurement
  • Optical Materials
  • Particle Bombardment
  • Physics
  • Radiation
  • Spectra
  • Spectroscopy
  • Transitions

Fields of Study

  • Physics

Readers

  • Electrochemical Engineering/ Fuel Cell Technologies
  • Materials Science and Engineering.
  • Thin Film Deposition Science.

Technology Areas

  • Microelectronics