Method for Long Term Ionizing Radiation Damage Predictions for the Space Environment

Abstract

The objective of the work is to predict the total dose damage from low level ionizing radiation sources for very long (5 years) exposure times. A prior effort to extrapolate annealing data to long times used linear systems theory or the convolution integral. Problems with the linear systems theory approach are: the damage is assumed to be linear even though the experimental data show a saturation effect; the annealing function, which is to be combined with the dose rate, needs to be known for a very long length of time (i.e., a 5- year observation of the annealing); and to do the integral numerically using data requires large amounts of computation. Keywords: Microelectronics, Radiation effects, Hardness assurance, Oxide charge, Surface effects, Total dose effects.

Open PDF

Document Details

Document Type
Technical Report
Publication Date
Aug 01, 1988
Accession Number
ADA199693

Entities

People

  • R. K. Maier

Organizations

  • Air Force Research Laboratory

Tags

Communities of Interest

  • Energy and Power Technologies

DTIC Thesaurus Topics

  • Algorithms
  • Computational Science
  • Computations
  • Convolution
  • Convolution Integrals
  • Dead Reckoning
  • Dose Rate
  • Experimental Data
  • Failure Mode And Effect Analysis
  • Integrals
  • Integrated Circuits
  • Ionizing Radiation
  • Linear Systems
  • Quantum Mechanics
  • Radiation
  • Radiation Effects
  • Radioactive Decay

Fields of Study

  • Physics

Readers

  • Approximation Theory.
  • Nuclear and Radiation Engineering.

Technology Areas

  • Microelectronics
  • Space