Electrical Degradation in Ceramic Dielectrics

Abstract

This report describes a continuation of an investigation of the mechanism of electrical degradation of ceramic dielectrics based on BaTiO3. The emphasis has been on the application of defect chemistry and electron microscopy in order to correlate degradation behavior with compositional and microstructural effects. The report is in four parts that deal with 1) an explanation for the earlier observation that samples that had been densified in a vacuum hot-press were unusually stable against voltage-temperature stress, 2) a simplified technique for determining the ionic contribution to the electrical conductivity, 3) an identification of the major charge carrier for the bulk leakage current, and 4) an investigation of the role of Mn in BaTiO3. Keywords: Dielectric degradation, Capacitor reliability, Ceramic capacitors, Barium titanates.

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Document Details

Document Type
Technical Report
Publication Date
Sep 09, 1988
Accession Number
ADA199833

Entities

People

  • Donald M. Smyth
  • Martin P Harmer

Organizations

  • Lehigh University

Tags

Communities of Interest

  • Advanced Electronics

DTIC Thesaurus Topics

  • Body Weight
  • Charge Carriers
  • Chemical Synthesis
  • Chemistry
  • Crystal Structure
  • Curie Temperature
  • Dielectrics
  • Electrical Conductivity
  • Electrical Properties
  • Electron Microscopy
  • Electrons
  • Grain Growth
  • Materials
  • Materials Engineering
  • Materials Science
  • Measurement
  • Microscopy

Fields of Study

  • Engineering

Readers

  • Surface Engineering/Surface Coating Technology.
  • Systems Analysis and Design
  • Thin Film Deposition Science.

Technology Areas

  • Microelectronics