Scanning Tunneling Microscopy as a Surface Chemical Probe

Abstract

The instrumentation needed for combining a new imaging technique, Scanning Tunneling Microscopy (STM), with standard surface analytical methods has been developed. The surface analytical capabilities of a new system have demonstrated by study of the Barium catalyzed oxidation of Nickel. The operation of the STM has been demonstrated by a detailed study of the imaging of the graphite surface. The changes in graphite imaging with tunneling voltage have been measured and compared with theoretical predictions of the effect of surface change density and surface deformation on imaging via STM. The combination of STM with the surface analytical probes has been demonstrated in a comparison of LEED and STM measurements of a stepped Si surface. It is shown that LEED is rather insensitive to structural changes that are readily apparent using STM.

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Document Details

Document Type
Technical Report
Publication Date
May 31, 1988
Accession Number
ADA199922

Entities

People

  • Ellen D. Williams

Organizations

  • University of Maryland

Tags

Communities of Interest

  • Energy and Power Technologies

DTIC Thesaurus Topics

  • Auger Electron Spectroscopy
  • Auger Electrons
  • Classification
  • Diffraction
  • Electron Energy
  • Electron Spectroscopy
  • Electrons
  • Imaging Techniques
  • Instrumentation
  • Low Temperature
  • Measurement
  • Microscopy
  • Scanning
  • Security
  • Spectra
  • Spectroscopy
  • Surface Analysis

Fields of Study

  • Physics

Readers

  • Computational Modeling and Simulation
  • Thin Film Deposition Science.