Modeling of Atomic Processes for X-Ray Laser Plasmas

Abstract

This work dealt with the theoretical modeling and computation of photoionization, photoexcitation, radiative decay and radiative recombination processes for multielectron atoms and ions in plasmas. Such atomic processes lead to and influence lasing in x-ray lasers operating both in the soft and hard x ray regions. This research utilized a two-component, finite temperature, self consistent density functional method and demonstrated that this method is applicable for arbitrary plasma density and temperature and is capable of accurately treating multielectron ions of arbitrary Z. Electron collisional ionization and excitation processes were investigated. These processes are an important mechanism through which population inversion of ionic energy levels lead to lasing in the soft x-ray region. Previously theoretical calculations utilizing a semi-classical impact approximation have been performed. In many cases such a method is inadequate. Computations were carried out by electron impact ionization and excitation cross-sections and rate coefficients utilizing the distorted wave with exchange method. Keywords: Photoionization, Photoexcitation, Plasmas, Multielectron, Atoms.

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Document Details

Document Type
Technical Report
Publication Date
Jul 01, 1988
Accession Number
ADA200219

Entities

People

  • Uday Gupta

Tags

Communities of Interest

  • Energy and Power Technologies

DTIC Thesaurus Topics

  • Air Force Facilities
  • Angular Momentum
  • Atomic Structure
  • Electromagnetic Radiation
  • Electrons
  • Energy Levels
  • Experimental Data
  • First Principles Calculations
  • Hard X Rays
  • Ionization
  • Radiation
  • Scientific Research
  • Soft X Rays
  • Three Dimensional
  • Wave Functions
  • X Ray Lasers
  • X Rays

Fields of Study

  • Physics

Readers

  • Computational Modeling and Simulation
  • Materials Science and Engineering.
  • Molecular Photonics/Laser Physics

Technology Areas

  • Directed Energy
  • Directed Energy - Lasers
  • Microelectronics