Beam Profile Studies for a One Eighth Betatron Wavelength Final Focusing Cell Following Phase Mixed Transport
Abstract
The focusing properties of a one eighth betatron wavelength cell are used to determine to what extent a modification of the initial phase space distribution of an ion beam can alter the number density profile of the beam at the focal plane. It is shown that the main modification is to alter the natural l/r profile to include an off-axis peak. The relative difficulty with the ion beams can be concentrated into this off-axis peak is then considered. Estimates of the source brightness (extraction ion diode source current density divided by the square of the microdivergence) required to deliver a given amount of beam into a given annular region at the focal plane are derived.
Document Details
- Document Type
- Technical Report
- Publication Date
- Oct 26, 1988
- Accession Number
- ADA200349
Entities
People
- J. J. Watrous
- Paul F. Ottinger
Organizations
- United States Naval Research Laboratory