Multiple Fault Diagnosis System
Abstract
The Navy currently uses Automated Test Systems (ATEs) to diagnose faults in most operational hardware units. There are numerous problems associated with the use of ATEs. The problems that can be solved through the application of improved technology involve high removal rate of good components, excessive levels of fault ambiguity, and lack of a successful diagnosis. Inherent in the use of ATEs are the two problems which render ATE use inefficient. They are expensive and highly specialized. A single multi-million dollar test unit may only test a single expert system which is knowledgeable about circuit operation in general and is thus able to diagnose faults in many different hardware units. It will be able to make suggestions, in an interactive manner with the technician, concerning the location of the next best test utilizing information from a priori failure rate database. Through a series of tests on the unit under test (UUT), the expert system will correctly isolate the fault. The objective of this project was to develop a versatile, interactive prototype of a fault diagnosis expert system capable of diagnosing multiple faults in generic electronic component systems and to test this system over several actual hardware setups capable of being faulted and subsequently tested.
Document Details
- Document Type
- Technical Report
- Publication Date
- Jun 10, 1988
- Accession Number
- ADA200406
Entities
People
- Bryan P. Graham
Organizations
- United States Naval Academy